High Responsivity UV Photoconductors Based on GaN Epilayers

Abstract

This paper will describe a new ultraviolet (UV) sensitive photoconductive detector based on gallium nitride (GaN) Material. Data will be presented on devices fabricated over the past several months. These devices have a high responsivity between 200 to 360 NM with a sharp long wavelength cutoff at 360 NM. The detectors have measured gains in excess 6000 and frequency responses of greater than 100 Hz. The devices have measured dynamic ranges of over four orders of magnitude and operate with bias voltages of 5 to 10 volts. Device designs will be shown that can be utilized in the development of a large monolithic focal plane for UV imaging

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Document Details

Document Type
Technical Report
Publication Date
Jul 01, 1992
Accession Number
ADA269797

Entities

People

  • Larry F. Reitz

Organizations

  • Wright Laboratory

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Air Force
  • Chemical Vapor Deposition
  • Compound Semiconductors
  • Detectors
  • Dynamic Range
  • Electro-Optics
  • Electronics
  • Frequency
  • Frequency Response
  • Gallium Nitrides
  • Governments
  • Long Wavelengths
  • Materials
  • Photoconductive Detectors
  • Semiconductors
  • Solid State Electronics
  • Wide Bandgap Semiconductors

Fields of Study

  • Physics

Readers

  • Semiconductor Device Technology

Technology Areas

  • Microelectronics