Thin Film Studies of the Proximity Josephson Effect

Abstract

The topics of theoretical and experimental interest in this research have been: The Proximity Induced Josephson Effect (PIJE), an effect occurring at a Normal Metal/Superconductor (N/S) interface which displays many of the features of the Josephson effect, the device potential of which has not been at all explored. The design and construction of a cryogenic scanning tunneling microscope capable of operating in ultra high vacuum. The Proximity Induced Josephson Effect (PIJE) has been observed at a Normal Metal/Superconductor (N/S) interfaces in point contact NS systems, and displays features resembling the Josephson effect. In experiments with Nb and Ta probes contacting MO and UBe13 (normal state) surface, the I(V) exhibit a low resistance segment centered at zero bias current resembling a Josephson current with a small series resistance R*, which has been interpreted as a spreading resistance in the normal state electrode.

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Document Details

Document Type
Technical Report
Publication Date
Sep 01, 1993
Accession Number
ADA270129

Entities

People

  • E. L. Wolf

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Critical Temperature
  • Electrical Measurement
  • Electrodes
  • Electrons
  • Fabrication
  • Films
  • Frequency
  • High Temperature
  • High Temperature Superconductors
  • Laboratory Equipment
  • Low Temperature
  • Magnetic Fields
  • Microscopes
  • Resistance
  • Semiconductors
  • Superconductors
  • Thin Films

Fields of Study

  • Physics

Readers

  • Electronics Engineering
  • Strategic Security Studies
  • Thin Film Deposition Science.