Tunneling Microscopy of Semiconductors
Abstract
This is the final report of research activities on Tunneling Microscopy of Semiconductor Surfaces, accomplished during a 3-year JSEP Graduate Fellowship awarded to Silva K. (Leonard) Thesis for work in the Harvard JSEP laboratory under the guidance of Prof. J. Golovchenko. The work includes: construction of a two-tip tunneling microscope, study of low coverage phases of Pb on Si(lll), study of surface diffusion of Pb on Ge(lll)-c(2x8), and study of Ge growth on Si(lll). Tunneling microscopy, Semiconductor surfaces, Surface diffusion.
Document Details
- Document Type
- Technical Report
- Publication Date
- Aug 31, 1993
- Accession Number
- ADA270232
Entities
People
- S. K. Theiss
Organizations
- Harvard University