VLSI Design for Reliability-Current Density

Abstract

This effort emphasizes the computation of the average and variance current density waveforms in the metal buses for estimating the MTF for electromigration effects. That effort is composed of two parts: The probabilistic simulation methods and software for computing the statistics of the current waveform at contact points to the buses; and the accurate extraction of the equivalent RC model of the bus for analyzing the bus currents. In addition, probabilistic methods have been applied to the calculation of the hot electron degradation in digital CMOS circuits, and the problem of estimating the maximum current (as opposed to the average) in the bus for worst case voltage drop analysis.

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Document Details

Document Type
Technical Report
Publication Date
Jul 01, 1993
Accession Number
ADA270719

Entities

People

  • G. Kamath
  • G. Stamoulis
  • H. Kriplani
  • I. N. Hajj
  • P. Li

Organizations

  • University of Illinois Urbana–Champaign

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Air Force
  • Algorithms
  • Circuits
  • Computational Science
  • Computations
  • Computer Programs
  • Computer-Aided Design
  • Current Density
  • Degradation
  • Extraction
  • Information Processing
  • Probability
  • Reliability
  • Simulations
  • Simulators
  • Statistics
  • Waveforms

Fields of Study

  • Engineering

Readers

  • Integrated Circuit Design and Technology.
  • Plasma Physics.
  • Regression Analysis.

Technology Areas

  • Microelectronics