ALE Project.

Abstract

The general goal of this work is to identify the chemical species that are present at the surface during atomic layer epitaxy (ALE). Particularly interesting is the nature of the passivation layer that terminates the broken bonds at the semiconductor surface in the first ALE step. Likewise, we follow the removal of the passivating species in the second step by thermal decomposition, desorption, irradiation, or chemical reaction. We use mainly surface-sensitive photoelectron spectroscopy at our beam line at the National Synchrotron Light Source (NSLS) in Brookhaven. During the past year we have built a new beam line at the Advanced Light Source (ALS) in Berkeley, which will exhibit 10,000 times higher brightness than NSLS. We expect the ALS beam line to become operational late '93 or early '94.

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Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1993
Accession Number
ADA271080

Entities

People

  • D. D. Koleske
  • D. Lapiano-smith
  • F. J. Himpsel
  • S. M. Gates
  • Subramanian S. Iyer

Organizations

  • IBM Thomas J. Watson Research Center

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Atomic Layer Epitaxy
  • Ceramic Materials
  • Chemical Reactions
  • Crystals
  • Desorption
  • Diffraction
  • Energy Bands
  • Epitaxial Growth
  • Films
  • Isothermal Processes
  • Mass Spectrometry
  • Materials
  • Measurement
  • Silicon Carbide
  • Spectra
  • Spectroscopy
  • Thermodynamics

Fields of Study

  • Physics

Readers

  • Educational Psychology
  • Electromagnetic Wave Scattering and Antenna Radiation Engineering
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene