Single-Event Upset Testing of the Performance Semiconductor 1750A CMOS/ SOS Chip Set

Abstract

Complex computer systems in space are vulnerable to many different environmental effects. One of the most difficult problems is survival under exposure to charged-particle radiation. Microelectronic devices are particularly sensitive to single-event upset-a change in the logic state of a dynamic node or memory cell due to interaction with cosmic rays. For reliable computing in satellite systems, designers must understand the sensitivity of the computer components to single-event upset. A description of tests performed on a MILSTD 1750A compliant microprocessor and peripherals is presented, and the results are used to estimate the single-event upset rate in space for each of the devices.

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Document Details

Document Type
Technical Report
Publication Date
Sep 30, 1993
Accession Number
ADA271158

Entities

People

  • James D. Kinnison

Organizations

  • Johns Hopkins University

Tags

Communities of Interest

  • Advanced Electronics
  • Biomedical
  • Energy and Power Technologies
  • Space

DTIC Thesaurus Topics

  • Artificial Satellites
  • Charged Particles
  • Complementary Metal-Oxide Semiconductors
  • Computer Components
  • Computers
  • Cosmic Rays
  • Electronics Laboratories
  • Instruction Set Architecture
  • Integrated Circuits
  • Microprocessors
  • Particles
  • Physics Laboratories
  • Radiation
  • Semiconductor Devices
  • Semiconductors
  • Spacecraft
  • Test Equipment

Fields of Study

  • Physics

Readers

  • Integrated Circuit Design and Technology.
  • Marine Mammal Biology
  • Pulsed Power and Plasma Physics.

Technology Areas

  • Microelectronics
  • Space