Microtribology of Magnetic Media. Revision
Abstract
Scanning tunneling microscopy (STM) atomic force microscopy (AFM), and the modification of AFMs (such as friction force microscopy (FFM)) are becoming increasingly important in the understanding of fundamental mechanisms of friction, wear and lubrication and in studying the interfacial phenomena in micro- and nanostructures used in magnetic storage devices and micro- electromechanical systems (MEMS). In the paper, we describe modified AFM and FFM techniques and present data microtribological studies of magnetic media-magnetic tapes and disks. Local variation in microscale friction is found to correspond to the local slope suggesting that ratchet mechanism is responsible for this variation. Wear rates for magnetic tapes are approximately constant for various loads and test duration. However, for the magnetic disks, the wear of the diamondlike carbon overcoat is catastrophic. Evolution of the wear has also been studied using AFM. AFM has been modified for nanoindentation hardness measurements. We have shown that hardness of ultra thin films can be measured using AFM. AFM has also shown to be useful for nanofabrication. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 01, 1993
- Accession Number
- ADA271209
Entities
People
- Bharat Bhushan
- Ju-ai Ruan
- Vilas N. Koinkar
Organizations
- Ohio State University