RF Vacuum Microelectronics
Abstract
We summarize our technical progress towards developing a thin-film edge emitter vacuum transistor capable of 1 GHz modulation. The first fabrication run of redesigned VME devices was completed. Analysis of this run shows poor step average of the metal runners interconnecting the emitters. This was a result of trying to take advantage of existing processing steps to form the interconnects. Design modifications subsequently were made to the masks and process to eliminate this problem and a second fabrication run has started. Using GaAs devices, we verified our ability to measure devices at 2 GHz with our vacuum test station.
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 21, 1993
- Accession Number
- ADA271805
Entities
People
- D. K. Arch
Organizations
- Honeywell International, Inc.