Structure and Morphology of Pd Overlayers on Epitaxial SnO2 Films Studies with the Atomic Force Microscope
Abstract
The structure and morphology of clean and Pd-doped epitaxial SnO2 films were studied with the atomic force microscope (AFM). The SnO2 films were grown by reactive sputter deposition on three different substrates yielding epitaxial orientations: (101) SnO2/r-cut sapphire, (100) SnO2/basal sapphire, and (110) SnO2/TiO2 (110). AFM imaging of monolayer amounts of Pd deposited onto the epitaxial SnO2 films shows that the Pd is dispersed at 300 K and forms clusters after annealing to 500 K in vacuum.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 01, 1993
- Accession Number
- ADA271827
Entities
People
- M. D. Antonik
- M. J. Matthews
- R. E. Cavicchi
- R. J. Lad
- S. Semancik
Organizations
- University of Maine