Direct Imaging of the Surface Microstructure of Dielectric Materials Using an Atomic Force Microscope
Abstract
An atomic force microscope was acquired and used to study the surface properties of polymers and ceramics. Studies of polymers included nanomachining, mechanical properties, wetting behavior of latex, and metallization. Studies of ceramics included faceting of TiO2 morphology of oxide fracture surfaces, heteroepitaxial oxide film growth, and oxidation of vanadium carbide. A prototype instrument for use in ultra-high vacuum was designed.
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 24, 1993
- Accession Number
- ADA272251
Entities
People
- R. J. Lad
- W. N. Unertl
Organizations
- University of Maine