A New Framework for Designing BIT Multichip Modules with Pipelined Test Strategy

Abstract

In this paper, a novel test strategy, the Loop Testing Architecture (LTA) is introduced to reduce aliasing probability and testing time for multichip modules. This is accomplished by connecting Cascadable Built-In Testers (CBITs) in neighboring pipelined stages to increase the length of the test suites. Fundamental properties of LTA supporting the randomness in the generated test patterns (state coverage) and the asymptotic aliasing probability are presented. Our results on two small-scale multi-processor configurations show that the aliasing probability in analyzing signatures compared to that of a MLFSR is comparable but with fairly low area overhead, and when compared with the Circular Self-Test Path technique, less testing time is required by LTA. Further evaluation on the potential capabilities provided by the LTA, compared with boundary scan and other pipelined test scheduling approaches confirmed that LTA provides a new framework for designing effective testable systems.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1993
Accession Number
ADA272646

Entities

People

  • Huoy-yu Liou
  • Ting-ting Lin

Organizations

  • University of California, San Diego

Tags

Communities of Interest

  • Energy and Power Technologies
  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Algorithms
  • Boundaries
  • Circuits
  • Computer-Aided Design
  • Computers
  • Demographic Cohorts
  • Fault Tolerance
  • Fault Tolerant Computing
  • Feedback
  • Frequency
  • Logic
  • Multichip Modules
  • Pseudo Random Sequences
  • Scheduling (Production)
  • Sequences
  • Shift Registers
  • Simulations

Fields of Study

  • Engineering

Readers

  • Integrated Circuit Design and Technology.
  • Parallel and Distributed Computing.
  • Unmanned Aerial System (UAS) Autonomous Capabilities and Mission Reconnaissance.