The Nanometer-Scale Mechanics of Gold Films

Abstract

We have used interfacial force microscopy (IFM) to monitor the mechanical deformation of single nanometer-sized grains in Au thin films. Our results show that protruding grains, which represent early-stage delamination, display multiple deformation mechanisms including grain-boundary sliding and intragranular plasticity. The unprecedented load displacement control capability of the IFM provides data that is used for the first time to quantitatively distinguish and evaluate individual deformation processes.

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Document Details

Document Type
Technical Report
Publication Date
Nov 23, 1993
Accession Number
ADA273307

Entities

People

  • Andrew J. Howard
  • J. E. Houston
  • P. Tangyunyong
  • R. C. Thomas
  • R. M. Crooks
  • T. A. Michalske

Organizations

  • University of New Mexico

Tags

Communities of Interest

  • Advanced Electronics
  • Sensors

DTIC Thesaurus Topics

  • Boundaries
  • Chemistry
  • Delamination
  • Displacement
  • Elastic Properties
  • Films
  • Grain Boundaries
  • Materials
  • Mechanical Properties
  • Mechanics
  • Microscopes
  • Modulus Of Elasticity
  • New Mexico
  • Plastic Deformation
  • Plastic Properties
  • Shear Stresses
  • Thin Films

Readers

  • Powder metallurgy of Titanium alloys.
  • Structural Health Monitoring of Composite Structures.
  • Thin Film Deposition Science.