Automated Fabric Inspection System
Abstract
The Automatic Fabric Inspection System developed by Systronics Inc. for Clemson Apparel Research uses vision technology to acquire images of the fabric two thousand times per second. Each image - video line consisting of 2048 picture elements is analyzed by a signal processing module and a decision on defect presence and location is made. A product norm signal is first established by having the system acquire an image of an unflawed stripe of the product. The output of each picture element (pixel) is digitized to a grey scale value in the 0 - 255 range. Threshold levels for defects with grey scale values higher and lower than product norm can then be established and set. The system will then compare all subsequent images against the set thresholds.
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 01, 1993
- Accession Number
- ADA274522
Entities
People
- Christine W. Jarvis