Aspects of Goodness-of-Fit
Abstract
In this article, two important methods of testing fit to a distribution are discussed and compared. They are the family of tests based on the empirical distribution function of a random sample, and the family based on plotting the order statistics against a suitable set of constants and examining the fit of a line through the plotted points. The two sets will be called EDF tests and Regression tests respectively.
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 30, 1993
- Accession Number
- ADA274826
Entities
People
- Michael A. Stephens
Organizations
- Stanford University