Multichip Module High Speed Testing
Abstract
Last quarter, we reported Al/SiO2/Al capacitor structures formed on an optical fiber, as the first step toward an electrooptic test probe. We have now fabricated an amorphous hydrogenated silicon (a-Si:H) photodetector directly on an optical fiber. We have been investigating the use of electrooptically active polymers for the purpose of electrooptic testing. Important problems remaining to be solved are low electrooptic efficiency and geometry; detection system speed, efficiency, and noise; and optical alignment.
Document Details
- Document Type
- Technical Report
- Publication Date
- Dec 31, 1993
- Accession Number
- ADA274873
Entities
People
- David H. Auston
- Robert J. Davis
Organizations
- Columbia University