Fault Coverage Measurement for Digital Microcircuits

Abstract

Procedure 5012 governs the measurement and reporting of fault coverage for digital microcircuits. This report expands on the published version of Procedure 5012 and explains the rationale behind the requirements of the procedure. The complete text of 5012, with additional annotations, is included in this technical report.

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Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1993
Accession Number
ADA276226

Entities

People

  • Anthony R. Macera
  • Daniel E. Daskiewich
  • Heather B. Dussault
  • Kevin A. Kwiat
  • Mark J. Gorniak
  • Warren H. Debany Jr.

Organizations

  • Rome Laboratory

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Air Force
  • Algorithms
  • Circuits
  • Detection
  • Electronic Equipment
  • Logic
  • Logic Gates
  • Mathematical Models
  • Measurement
  • Microcircuits
  • Models
  • Power Supplies
  • Probability
  • Sampling
  • Simulations
  • Statistical Samples
  • Test Equipment

Fields of Study

  • Physics

Readers

  • Computer Science.
  • Integrated Circuit Design and Technology.
  • Library and Information Science

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems