New and Emerging Techniques for Imaging Surfaces

Abstract

The development of techniques for real-time in-situ imaging of surfaces and for spatially resolved spectroscopic imaging of surfaces is reviewed. The capabilities of Field-Ion Microscopy, In-Situ Transmission Electron Microscopy, Low-Energy Electron Microscopy, Point Projection Microscopy, In-Situ Scanning Electron Microscopy, NearField Scanning Optical Microscopy, Photo-emission Electron Microscopy, Plane-View Transmission Electron Microscopy, Reflection Electron Microscopy, Scanning Electron Microscopy with Polarization Analysis, Scanning Micro-cathodoluminescence, and Scanning Tunneling Microscopy are summarized. Surface structure, Imaging, TEM, STM, LEEm, PEEm, SEM, STEM

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1994
Accession Number
ADA276497

Entities

People

  • Ellen D. Williams
  • Laurence D. Marks

Organizations

  • Northwestern University

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Chemical Reactions
  • Data Acquisition
  • Detectors
  • Diffraction
  • Electron Beams
  • Electron Microscopy
  • Emission
  • Energy Bands
  • Materials
  • Materials Science
  • Microscopes
  • Microscopy
  • Optical Properties
  • Optics
  • Scanning Electron Microscopy
  • Scattering
  • Transmission Electron Microscopy

Fields of Study

  • Physics

Readers

  • Nanoscale Plasmonic Nanotechnology
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics