A HIFX Electron-Beam Dosimetry System
Abstract
The U.S. Army Research Laboratory has developed a dosimetry system for use with the High-intensity Flash X-ray (HIFX) facility and the custom low- noise test fixture used to perform radiation tests of integrated circuits in vacuum. When the flash x-ray is used in its electron-beam mode, dose rates greater than 10(exp13) rads(Si)/s are achievable. This dose rate is above the useful limit of more conventional dosimetric methods, such as thermoluminescent dosimeters (TLD's). Our method, which uses chromel-constantan thermocouples to measure electron beam intensity, also eliminates the necessity of breaking vacuum between shots to replace dosimeters, a process that greatly reduces the number of shots performable per day. This paper describes the dosimetry system and the results of experiments and calculations that correlate thermocouple voltages and radiation dose. We also describe methods of varying the dose rate of the HIFX electron beam.
Document Details
- Document Type
- Technical Report
- Publication Date
- Feb 01, 1994
- Accession Number
- ADA276596
Entities
People
- Gregory K. Ovrebo
- Steven M. Blomquist
- Steven R. Murrill
Organizations
- United States Army Research Laboratory