The Impact of ASIC Devices on the SEU Vulnerability of Space-Borne Computers.

Abstract

Application specific integrated circuits (ASICs) offer a number of advantages over traditional multi-component microcircuits including reductions in both size and power dissipation, and are therefore prime candidates to replace such microcircuits in space-borne electronics systems. The results of recent tests of the susceptibilities of various ASIC devices to cosmic ray and trapped proton induced single event upset (SEU) and latchup are reported here and are compared to the susceptibilities of the devices that they would replace. This comparison leads to a discussion of the impact of ASIC devices on the SEU susceptibility of space-borne computers. ASIC, SEU, FPGA, PLA, PLD, CMOS, LSI, SSI, MSI, Latchup, Spaceborne computer.

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Document Details

Document Type
Technical Report
Publication Date
Jan 30, 1994
Accession Number
ADA278134

Entities

People

  • K. B. Crawford
  • Rokutano Koga
  • S. D. Pinkerton
  • S. J. Hansel
  • W. R. Crain

Organizations

  • The Aerospace Corporation

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Application-Specific Integrated Circuits
  • Circuits
  • Complementary Metal-Oxide Semiconductors
  • Computers
  • Cosmic Rays
  • Electronics
  • Electronics Laboratories
  • Environment
  • Field Programmable Gate Arrays
  • Integrated Circuits
  • Microcircuits
  • Physics Laboratories
  • Power Electronics
  • Radiation
  • Semiconductor Devices
  • Semiconductors
  • Standards

Fields of Study

  • Physics

Readers

  • Integrated Circuit Design and Technology.
  • Plasma Physics / Magnetohydrodynamics

Technology Areas

  • Microelectronics
  • Space