Rapid and Accurate Timing Simulation of Radiation-Hardened Digital Microelectronics Using VHDL

Abstract

This dissertation presents the development of a fast, accurate, timing simulation capability based on VHSIC Hardware Description Language (VHDL) without the use of back annotation of timing delay information. This VHDL-based timing simulator is intended for use with radiation-hardened microelectronics in simulating timing of circuit operation in pre-radiation, post-radiation (1 Mrad(Si) total dose), and ionizing dose radiation environments. Development of the timing models are presented. The implementation of the timing models are incorporated into a VHDL library composed of basic logic gates and flip-flops. Simulations of complex circuits were run in SPICE and VHDL to assess the timing accuracy and simulation run time of the VHDL-based timing simulator versus SPICE. Results of the simulations are presented. Final evaluation of the simulator included testing of a microprocessor control unit. In all cases, the VHDL-based simulation ran over two orders of magnitude faster than the equivalent SPICE simulation. In the pre- and post-radiation environment, accuracy estimates are usually within five percent and never exceed 12 percent. Worst-case timing estimate errors increase above 15 percent for dose rates above 1.Ox1O(exp 11) rads(Si) per second. This VHDL-based timing simulator represents an improvement over SPICE in the ability to quickly simulate complex circuits. CMOS Logic simulation, Logic circuit simulation, Radiation-hardened microelectronics, Transient radiation effects, VHDL.

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Document Details

Document Type
Technical Report
Publication Date
Mar 01, 1994
Accession Number
ADA278644

Entities

People

  • Charles P. Brothers Jr.

Organizations

  • Air Force Institute of Technology

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Circuit Analysis
  • Complementary Metal-Oxide Semiconductors
  • Computers
  • Differential Equations
  • Digital Circuits
  • Electronic Circuits
  • Fabrication
  • Failure Mode And Effect Analysis
  • Field Effect Transistors
  • Integrated Circuits
  • Ionizing Radiation
  • Logic Gates
  • Metal Oxide Semiconductors
  • Nand Gates
  • Radiation Effects
  • Semiconductors
  • Very Large Scale Integration

Fields of Study

  • Physics

Readers

  • Integrated Circuit Design and Technology.

Technology Areas

  • Microelectronics