The Reliability of Laser Reflowed Sn-Ag Solder Joints

Abstract

This is the first quarterly report of a project aimed at determining the reliability of electronic interconnects made with Sn-3.5wt%Ag solder alloy. The reliability of solder interconnects is primarily determined by two factors: (1) the type of electronic assembly; and (2) the environment to which the assembly is exposed. These two factors (each composed of several variables i.e. assembly thermal expansion coefficients, elastic moduli of assembly members, maximum operating temperature, rate of temperature change, etc.) boil down to three critical parameters; temperature, strain and strain rate (or stress). The interdependence of these variables must first be explored when addressing a creep-fatigue problem such as the case of solder joints. Specific environment (beyond temperature) and state of stress at a propagating crack, which are determined by the specific application and package geometry, are being neglected at this point in time. Little involving the creep or fatigue properties of Sn-3. 5Ag is reported in the literature. Prior studies have used unique joint geometries to measure joint properties.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
May 04, 1994
Accession Number
ADA279787

Entities

People

  • C. H. Raeder
  • D. L. Millard
  • R. W. Messler

Organizations

  • Rensselaer Polytechnic Institute

Tags

Communities of Interest

  • Advanced Electronics
  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Air Cooled
  • Assembly
  • Chemical Analysis
  • Chemical Composition
  • Climate Change
  • Environment
  • Experimental Data
  • Geometry
  • Heat Of Activation
  • Joints
  • Manufacturing
  • Reliability
  • Soldered Joints
  • Steady State
  • Strain Rate
  • Thermal Expansion

Fields of Study

  • Engineering

Readers

  • Combustion and Flow Dynamics.
  • Electrical Engineering
  • Materials Science (Mechanical Engineering).

Technology Areas

  • Directed Energy
  • Microelectronics