A Low Temperature, Ultrahigh Vacuum, Microwave-Frequency-Compatible Scanning Tunneling Microscope

Abstract

To expand the capabilities of the microwave frequency alternating current scanning tunneling microscope to include the ability to study isolated adsorbates and highly reactive surfaces, we have developed a low temperature, ultrahigh vacuum alternating current scanning tunneling microscope. In this alternating current scanning tunneling microscope, we employ the reliable beetle-style sample approach mechanism with a number of other components unique to a low temperature scanning tunneling microscope. These include the sample transfer, delivery, retrieval, storage, sputtering, and heating systems. This alternating current scanning tunneling microscope has been operated at 77K and 4K.

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Document Details

Document Type
Technical Report
Publication Date
May 01, 1994
Accession Number
ADA279869

Entities

People

  • M. M. Kamna
  • Paul S. Weiss
  • S. J. Stranick

Organizations

  • Pennsylvania State University

Tags

DTIC Thesaurus Topics

  • Assembly
  • Chemistry
  • Coaxial Cables
  • Electron Beams
  • Electrons
  • Elements
  • Frequency
  • Heating
  • Heating Elements
  • Low Temperature
  • Microscopes
  • Piezoelectric Transducers
  • Quantum Tunneling
  • Scanning
  • Sputtering
  • Stainless Steel
  • Tunneling

Fields of Study

  • Physics

Readers

  • Thin Film Deposition Science.