Combined Atomic Force and Scanning Reflection Interference Contrast Microscopy
Abstract
A sphere attached to a cantilever is used simultaneously as an atomic force microscope (AFM) tip and as a curved reflective surface for producing scanning reflection interference contrast microscope (RICM) images of fluorescent beads dried onto a glass slide. The AFM and RICM images are acquired in direct registration which enables the identification of individually excited beads in the AFM images. The addition of a sharp, electron beam-deposited tip to the sphere gives nanometer resolution AFM images without loss of optical contrast. Method of combining an Atomic Force Microscope (AFM) with a Reflection, Interference Contrast Microscope (RICM).
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 01, 1994
- Accession Number
- ADA280341
Entities
People
- M. Radmacher
- P. E. Hillner
- Paul K. Hansma
Organizations
- University of California, Santa Barbara