Scanning Tunneling Microscopy/Atomic Force Microscopy for Study of Nanoscale Metal Oxide Particles (Destructive Adsorbents)

Abstract

A modern scanning tunneling microscopy/atomic force microscopy instrument was purchased. This instrument is allowing physical characterization of nanoscale particles of metal oxides. These particles are known to be effective reagents for the destruction of military toxins as well as chlorocarbons by a process we call destructive adsorption. Nanoscale particles, Destructive adsorption, Atomic force microscopy, Scanning, Tunneling, Scanning probe.

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Document Details

Document Type
Technical Report
Publication Date
Jun 15, 1994
Accession Number
ADA281417

Entities

People

  • Dong Hun Park
  • Kenneth J. Klabunde

Organizations

  • Kansas State University

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Abstracts
  • Adsorbents
  • Chemical Warfare Agents
  • Chemistry
  • Corporations
  • Materials
  • Metal Oxides
  • Microscopes
  • Microscopy
  • Military Research
  • Nitrogen Compounds
  • Oxides
  • Particles
  • Physical Properties
  • Quantum Tunneling
  • Scanning
  • Surface Chemistry

Fields of Study

  • Physics

Readers

  • Nanoscale Plasmonic Nanotechnology