Reliable Advanced Electronic Systems Research

Abstract

The SDI Mission requires the production of systems that can operate reliably for long time periods without maintenance. Such systems are feasible only if they can be manufactured and assembled without defects, and run-time errors can be promptly and accurately identified. The major objectives of this project were new production test methods to eliminate chips with latent failures; and fault-tolerance structures designed specifically for temporary as well as permanent failures.

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Document Details

Document Type
Technical Report
Publication Date
Jun 23, 1993
Accession Number
ADA282791

Entities

People

  • Edward J. Mccluskey

Organizations

  • Stanford University

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Circuits
  • Complementary Metal-Oxide Semiconductors
  • Computer Science
  • Computer-Aided Design
  • Computers
  • Detection
  • Digital Circuits
  • Electrical Engineering
  • Electronics
  • Failure Mode And Effect Analysis
  • Fault Tolerance
  • Fault Tolerant Computing
  • Integrated Circuits
  • Numerical Analysis
  • Test And Evaluation
  • Test Methods
  • Test Sets

Readers

  • Parallel and Distributed Computing.
  • Software Engineering
  • Systems Analysis and Design

Technology Areas

  • Microelectronics