Neural Networks Modeling for Yield Enhancement in Semiconductor Manufacturing

Abstract

Major tasks planned during the first period of the research project have been the analysis of data and evaluation of its statistical properties. Selection of feasible neural network architectures and their feasibility study have been pursued. Also, development of data manipulation software has been facilitated during the initial phase of the project work for the purpose of properly interfacing data with the neural network models

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Document Details

Document Type
Technical Report
Publication Date
Jan 31, 1993
Accession Number
ADA282793

Entities

People

  • Jacek M. Zurada

Organizations

  • University of Louisville

Tags

Communities of Interest

  • Advanced Electronics
  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Circuits
  • Computer Programs
  • Computers
  • Computing System Architectures
  • Data Analysis
  • Data Sets
  • Databases
  • Dimensionality Reduction
  • Fabrication
  • Information Science
  • Measurement
  • Networks
  • Neural Networks
  • Semiconductor Manufacturing
  • Semiconductors
  • Test Sets
  • Training

Readers

  • Neural Network Machine Learning.
  • Software Engineering

Technology Areas

  • AI & ML
  • AI & ML - Neural Networks
  • Microelectronics