Low Energy Electron/Atom Elastic Scattering Cross Sections from 0.1-30 keV

Abstract

Empirical forms for electron/atom scattering cross sections predict backscattering factors that compare well with those calculated using tabulated Mott data from 0.1 to 30keV. The form of the empirical total cross section is similar to the screened Rutherford cross section. The fit to the tabulated differential Mott cross sections is decomposed into two parts, one part being of the same mathematical for as the screened Rutherford cross section and the second part being an isotropic distribution. The ratio of the total cross sections between the screened Rutherford part of the differential scattering cross section and the isotropic part of the distribution, is fitted to give the same ratio of forward to backscattered currents as the tabulated Mott differential cross sections. The three equations, one for the total elastic cross section and two equations describing the differential cross section, one for the Rutherford screening parameter and one for the ratio of total cross section give backscattering results covering all the major trends with energy and atomic number compared to the backscattering coefficients calculated using tabulated Mott cross sections.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1994
Accession Number
ADA283584

Entities

People

  • B. Chui
  • D. C. Joy
  • Jun Ye
  • R. Browning
  • Roger Fabian W. Pease
  • T. Z. Li
  • Z. Czyzewski

Organizations

  • Stanford University

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Atoms
  • Backscattering
  • Contamination
  • Databases
  • Differential Cross Sections
  • Elastic Scattering
  • Electron Energy
  • Electron Microscopes
  • Electron Scattering
  • Electrons
  • Energy
  • Forward Scattering
  • Mean Free Path
  • Periodic Variations
  • Scanning Electron Microscopes
  • Scattering
  • Scattering Cross Sections

Fields of Study

  • Physics

Readers

  • Quantum spin resonance or Electron Paramagnetic Resonance spectroscopy.
  • Solar Physics

Technology Areas

  • Microelectronics