Mass Spectrometric Studies of Clusters and Surfaces
Abstract
Fourier transform ion cyclotron resonance (FTICR) mass spectrometry was used to obtain information about the reactivity and physical properties of gaseous cluster ions, and to develop various mass spectrometric surface and bulk analysis techniques. New values for electron affinities and ionization potentials of many different semiconductor clusters were determined. Ultra-high resolution glow discharge FTICR mass spectrometry was developed to better characterize solid materials.
Document Details
- Document Type
- Technical Report
- Publication Date
- Aug 29, 1994
- Accession Number
- ADA283992
Entities
People
- John R. Eyler
Organizations
- University of Florida