Atomic Scale Force Mapping with the Atomic Force Microscope

Abstract

The ability to recognize differences between atoms in topographically similar positions has been a long-standing goal in Atomic Force Microscopy especially in a biological context. Mapping of forces (often attractive) at very small (< 5 A) tip-sample separations is one plausible way to achieve this. We have measured these types of forces above crystalline surfaces in water. Atomic resolution on attractive forces is demonstrated on the cleavage planes of calcite and muscovite mica. Atomic scale variations in the force between the tip and sample as a function of lateral position are observed on calcite.

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Document Details

Document Type
Technical Report
Publication Date
Sep 01, 1994
Accession Number
ADA284940

Entities

People

  • J. P. Cleveland
  • M. Radmacher
  • Paul K. Hansma

Organizations

  • University of California, Santa Barbara

Tags

Communities of Interest

  • Air Platforms

DTIC Thesaurus Topics

  • Adhesion
  • Cells
  • Contrast
  • Data Processing
  • Deflection
  • Electron Microscopy
  • Frequency
  • Fungi
  • Materials
  • Microscopes
  • Microscopy
  • Military Research
  • Models
  • Phyllosilicates
  • Power Supplies
  • Resonant Frequency
  • Scanning Electron Microscopy

Readers

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  • Materials Science and Engineering.
  • Thin Film Deposition Science.