High Brightness Cathodes for Microfocus X-Ray Generators
Abstract
Nondestructive inspection techniques such as Computed Tomography (CT) and Backscatter Imaging Tomography (BIT) have advanced to the point where detectors and image processors have reached a plateau in performance. Further improvement in the inspection techniques must come from better X-ray sources. Microfocus X-ray sources offer this improved performance due to their small X- ray spot size, which is generally on the order of tens of microns. The small spot approximates a point source, which reduces geometric distortions of the image. The sources currently available, however, frequently do not meet industrial user maintenance and ease-of-use standards, especially with regard to beam stability and electron emitter lifetime. By using new emitter materials, careful electron gun design, and proper high-vacuum construction techniques, we have developed a high-energy (360 keV), low-maintenance microfocus X-ray source with the improved performance required to meet these demands. X-Ray sources, Computed tomography, 360 keV Microfocus x-ray
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 27, 1994
- Accession Number
- ADA285256
Entities
People
- C. H. Shaughnessy
- H. J. Hansen
- P. H. Leek
- S. P. Renwick