The Effect of Violations of the Constant Demand Assumption on the Defense Logistic Agency Requirements Model

Abstract

This project determined the impact of stationary but noncontinuous demand levied in a multi-echelon system. Specifically discussed is how this lumpy demand affected the Defense Logistics Agency, Defense Electronics Supply Center in its computed inventory levels and total variable costs. To determine the impact of lumpy demand, data was extracted from the Defense Logistics Agency, Defense Electronics Supply Center Dayton, Ohio. Based on patterns of demand and distributions, the authors constructed a SLAM 2 model that depicted lumpy orders being received at the Defense Logistics Agency. The SLAM 2 model was constructed for the proposed system and simulation runs were conducted using demand distributions gathered from the sample data set. These runs indicate that lumpy demand does impact negatively total variable cost and on-hand inventory levels. It is recommended the Defense Logistics Agency consider other lot sizing techniques or look into a Distribution Resource Planning model to improve overall system inventory levels and total variable costs. Defense Logistics Agency, Economic order quantity, Lot sizing, Lumpy demand, Inventory management, Logistics planning, Consumables, Multi-Echclon.

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Document Details

Document Type
Technical Report
Publication Date
Sep 01, 1994
Accession Number
ADA285272

Entities

People

  • Douglas H. Engberson
  • William S. Long

Organizations

  • Air Force Institute of Technology

Tags

Communities of Interest

  • Ground and Sea Platforms

DTIC Thesaurus Topics

  • Air Force
  • Air Force Facilities
  • Computer Programming
  • Computer Programs
  • Computers
  • Data Analysis
  • Experimental Design
  • Information Science
  • Logistics
  • Logistics Management
  • Logistics Planning
  • Maintenance
  • Procurement
  • Simulations
  • Statistical Analysis
  • Supply Chain Management
  • Supply Depots

Readers

  • Logistics and Supply Chain Management.

Technology Areas

  • Microelectronics