European Symposium on X-Ray Topography and High Resolution Diffraction (2nd) Held in Berlin, Germany on 5-7 September 1994. Programme and Abstracts
Abstract
Partial Contents: Early experimental proofs of the dynamical theory; Topography in magnetism: domain and phase transition investigations; Diffraction topographic investigations of crystals under applied electric fields; Dependence of defect arrangement in crystals on surface morphology and on conditions of growth from solution; Interaction of slip bands with grain boundaries - observation by white beam SR topography; In-situ X-ray topography studies during the MBE growth process of InGaAs strained layers; Double- and triple-crystal X- ray diffraction analysis of semiconductor quantum wires; Applications in multiple crystal diffractometry; Interpretation of the diffraction profile resulting from strain relaxation in epilayers; Study of thin buried interfaces in III-V compound hetero-structures by high resolution X-ray diffraction
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 07, 1994
- Accession Number
- ADA286328
Entities
Organizations
- University of Bonn