The Application of Surface Analysis to Polymer/Metal Adhesion

Abstract

The use of scanning electron microscopy (SEM) and x-ray photoelectron spectroscopy (XPS) in the analysis of Ti 6-4 adherend surfaces is described. Differences in Ti 6-4 surface composition as determined by XPS after different chemical pre treatments are detailed. Analysis of fractured surfaces by SEM/XPS is used to establish the failure mode. The surface acidity of Ti 6-4 coupons can be established by reflectance visible spectroscopy using indicator dyes.

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Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1981
Accession Number
ADA286879

Entities

People

  • James P. Wightman

Organizations

  • Virginia Tech

Tags

Communities of Interest

  • Advanced Electronics
  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Acids
  • Adhesion
  • Adhesives
  • Chemical Synthesis
  • Chemistry
  • Electron Microscopy
  • Electron Spectroscopy
  • Electrons
  • Failure Mode And Effect Analysis
  • High Temperature
  • Indicator Dyes
  • Oxides
  • Scanning Electron Microscopy
  • Spectra
  • Spectroscopy
  • X Ray Photoelectron Spectroscopy
  • X Rays

Fields of Study

  • Materials science

Readers

  • Electrochemical Engineering/ Fuel Cell Technologies
  • Nanoscale Plasmonic Nanotechnology
  • Surface Coatings Technology.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene