Multipurpose Processor (MPP) Accelerated Reliability Test Plan

Abstract

The Multipurpose Processor (MPP) is a new development system designed to provide array receiver and beamforming processing. The MPP, based on commercial off-the-shelf technologies, is critical to follow-on AN/BSY-1 system performance improvements. Current specifications require implementation of an extended reliability prediction, reliability development test (RDT), and failure analysis and corrective action system to assess hardware performance during system development. Traditional RDT methodology focuses on reliability growth at the lowest possible component level, implements sequential and separate tests for different environments, requires a minimum expected test time of three to five times the mean time between failure, and does not provide timely feedback to the design community. Furthermore, parts of the RDT process are not clearly applicable in a system development where COTS equipment is utilized. The accelerated reliability test (ART) plan presented here would provide accurate reliability data in shorter time frames at reduced cost. ART methodology uses design of experiments to rationalize test performance; reduces the individual trial times, thereby reducing associated costs; implements combined stress testing; and implements stress range from operational to maximum design. This document details the development and application of ART methodology and present a detailed plan for MPP testing.

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Document Details

Document Type
Technical Report
Publication Date
Mar 29, 1996
Accession Number
ADA286900

Entities

People

  • Mandeep K. Nehra

Organizations

  • Naval Undersea Warfare Center

Tags

Communities of Interest

  • Ground and Sea Platforms

DTIC Thesaurus Topics

  • Attack Submarines
  • Data Science
  • Engineering
  • Engineers
  • Experimental Design
  • Failure Analysis
  • Information Processing
  • Information Science
  • Mathematical Analysis
  • Mathematics
  • Reliability
  • Standards
  • Test And Evaluation
  • Test Equipment
  • Test Facilities
  • Test Methods
  • Undersea Warfare

Fields of Study

  • Engineering

Readers

  • Life Cycle Cost Analysis
  • Parallel and Distributed Computing.
  • Systems Analysis and Design