Theory and Software for Light Scattering from Multilayer Optical Components with Interfacial Roughness.
Abstract
First-order perturbation theory is applied to calculate the angular distribution of light scattered when a monochromatic plane wave illuminates a multilayer optical component. The light scattering is assumed to be caused by random roughness at each interface of the multilayer component where the root-mean-square (rms) roughness at any interface is assumed to be much less than the incident wavelength. Input parameters include the incident polarization, angle of incidence, wavelength, rms, and correlation length values for each interface, as well as the design of the multilayer stack. The superstrate medium can be any lossless transparent material. The layer of the multilayer stack and substrate media can be transparent or metallic. Output includes scattered power per unit solid angle normalized to the incident power. The scattered field is considered in both reflection- and transmission-scattering hemispheres. Also, the polarization of the scattered field is retained. Correlated and uncorrelated statistical models for the interface roughness are considered; however, partial correlation is discussed. Numerous equations in the theory are related to the FORTRAN code software listing. Instructions are given to use the software for numerical analysis. Four examples are given along with input data files, listing of numerical output, and plots of numerical output.
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 01, 1992
- Accession Number
- ADA288387
Entities
People
- J. M. Elson
Organizations
- Naval Air Warfare Center Weapons Division