Analytical Electron Microscopy of Nanometer-Sized Particles.

Abstract

During the past quarter, despite lengthy downtime for the JEOL 4000FX, two aspects of our research plan were initiated: microdiffraction and the effects of prolonged beam exposure on the EELS signature of U oxides. While obtaining microdiffraction patterns, it was recognized that high resolution electron microscope images can be obtained on thin sections produced by ultramicrotomy.

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Document Details

Document Type
Technical Report
Publication Date
Dec 19, 1994
Accession Number
ADA289124

Entities

People

  • Stephen B. Rice

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Ceramic Materials
  • Contracts
  • Crystal Structure
  • Crystallites
  • Crystals
  • Current Density
  • Diffraction
  • Downtime
  • Electron Beams
  • Electron Diffraction
  • Electron Microscopes
  • Electron Microscopy
  • Electrons
  • High Resolution
  • High Voltage
  • Microscopes
  • Spectra

Fields of Study

  • Physics

Readers

  • Systems Analysis and Design
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene