Experimental Methods in Residual Stress Measurement Using a Position-Sensitive Single-Exposure Scintillation Detection System.
Abstract
In the Denver D-1000-A single-exposure position-sensitive scintillation detection (PSSD) system, surface residual stress measurement in any chosen direction is based on crystalline plane spacings determined in two directions normal to the surface made simultaneously in a single psi tilt. This technical allows fast, noncontacting, and nondestructive biaxial stress analysis. In this report, system performance is characterized by studying the noise, gain, and diffraction peak profiles as a function of diode array element. A four-point bend experiment was performed to determine the elastic constant of the 211 plane of body-centered cubic martensitic steel. Residual stress measurements were performed in several steel specimens and compared to measurements made on a similar system at Pennsylvania State University. Local software development allowed the single-exposure PSSD to run in a multiple-exposure mode for improved accuracy in biaxial stress analysis. (MM)
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 01, 1994
- Accession Number
- ADA289803
Entities
People
- G. P. Capsimalis
- M. Doxbeck
- S. L. Lee
Organizations
- United States Army Armament Research, Development and Engineering Center