Thin-Film Resistor Array Characterization.
Abstract
This paper provides the results of thin-film resistor array testing which was recently performed at the System Simulation and Development Directorate (SS&DD), Research, Development, and Engineering Center (RDEC). The objective of these tests was to determine the suitability of the Australian thin-film resistor technology for use as a key component in an Infrared Scene Projector (IRSP) for Hardware-in-the-Loop (HWIL) simulations involving systems which utilize linear rows of detectors. The tests were configured to measure spatial uniformity, temporal response, dynamic range, and relative energy output as a function of power input. D65O funding was used to purchase the resistor arrays. (MM)
Document Details
- Document Type
- Technical Report
- Publication Date
- Dec 01, 1994
- Accession Number
- ADA289806
Entities
People
- Scott Mobley
- Vicki Sanderford
Organizations
- United States Army Aviation and Missile Command