The In Situ Observation of Epitaxial Diamond Thin Film Nucleation and Growth Using Emission Electron Microscopy.

Abstract

A variety of natural and chemical vapor deposited diamond surfaces have been imaged using a photoelectron emission microscope and synchrotron radiation in the 4-18 eV and 250-350 eV range. Both images and spatially resolved total electron yield curves were acquired simultaneously. Near-edge spectra at the carbon is edge show a resonance due to graphite; the image intensity varies uniformly in proportion to the C 1s edge intensity. In the 4-18 eV range, no sharp features related to a photoemission threshold were observed below 7 eV in the electron yield curves on any of the specimens. The image contrast was not strongly dependant on the illumination energy. Natural type IIa diamond showed severe charging effects. (jg)

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Document Details

Document Type
Technical Report
Publication Date
Jan 02, 1995
Accession Number
ADA289841

Entities

People

  • Martin E Kordesch

Organizations

  • Ohio University

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Chemical Reactions
  • Chemical Vapor Deposition
  • Crystal Structure
  • Electron Emission
  • Electron Microscopy
  • Emission
  • Emitters
  • Materials
  • Measurement
  • Microscopy
  • Photoelectric Emission
  • Photoelectrons
  • Photoexcitation
  • Spectra
  • Spectroscopy
  • Subatomic Particles
  • Two Dimensional

Fields of Study

  • Physics

Readers

  • Image Processing and Computer Vision.
  • Materials Science and Engineering.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene