Characterization and Calibration of a Pulsed Laser System for Single Event Upset Simulation.

Abstract

A pulsed Nd: Glass laser facility that was developed at Defence Research Establishment Ottawa, for the simulation of single event upsets (SEUs) in electronics, is described in detail. The performance of the laser system, the associated instrumentation and data acquisition systems were extensively characterized during the process of studying the charge collected in a silicon p-i-n photodiode, due to laser and ion-induced SEU. Laser simulation of SEUs is demonstrated to be an accurate and convenient complementary method to ion accelerator-based SEU experimentation. (MM)

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Document Details

Document Type
Technical Report
Publication Date
Nov 01, 1994
Accession Number
ADA290075

Entities

People

  • A. Fechete
  • G. T. Pepper

Organizations

  • Defence Research and Development Canada

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Accuracy
  • Acquisition
  • Air Pressure
  • Alpha Decay
  • Alpha Particles
  • Alpha Spectra
  • Charge Coupled Devices
  • Electromagnetic Shielding
  • Laser Applications
  • Laser Beams
  • Lasers
  • Measurement
  • Optical Properties
  • Semiconductor Devices
  • Semiconductors
  • Spectra
  • Two Dimensional

Fields of Study

  • Physics

Readers

  • Computational Modeling and Simulation
  • Optical Physics and Photonics.
  • Pulsed Power and Plasma Physics.

Technology Areas

  • Directed Energy
  • Microelectronics
  • Microelectronics - Microelectromechanical Systems