Proceedings of the International Conference on Nondestructive Characterization of Materials (6th) Held at Oahu, Hawaii on 7-11 June 1993.
Abstract
The role of nondestructive testing has expanded far beyond its historical mission of detecting macroscopic defects in structures and devices which had already been constructed and most often had been in service for an extended period of time. Today, and ever increasingly in the future, using advanced sensors and modern measurement technology, along with signal/data processing techniques, information on the processing conditions and the properties and characteristics of the materials being processed can be continuously generated. Real-time process monitoring for more effective and efficient real-time process control and improved product quality and reliability will now become a practical reality. The optimization of the processing and properties of polymers, ceramics and composites, the development of synthetically structured materials, the characterization of surfaces and interfaces, the measurement and character-characterization of amorphous metals and semiconductors, the growth of perfect electronic and optical crystals and thin films, and in all cases, the structures, devices and systems made from these materials demand the innovative application of modem nondestructive materials characterization techniques to monitor and control as many stages of the production process as possible. Simply put, intelligent manufacturing is impossible without integrating modem nondestructive evaluation into the production system. (MM)
Document Details
- Document Type
- Technical Report
- Publication Date
- Dec 01, 1994
- Accession Number
- ADA290727
Entities
People
- Clayton O. Ruud
- Krzysztof J. Kozaczek
- Robert E. Green Jr.
Organizations
- Pennsylvania State University