Investigation and Characterization of SEU Effects and Hardening Strategies in Avionics.

Abstract

Data from military/experimental flights and laboratory testing indicate that typical non-radiation-hardened 64k and 256k static random access memories (SRAMs) can experience a significant soft upset rate at aircraft altitudes due to energetic neutrons created by cosmic ray interactions in the atmosphere. It is suggested that error detection and correction (EDAC) circuitry be considered for all new avionics designs containing large amounts of semiconductor memory. (MM)

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Feb 01, 1995
Accession Number
ADA291058

Entities

People

  • Allen H. Taber
  • Eugene Normand

Organizations

  • Boeing Defense, Space & Security

Tags

Communities of Interest

  • Advanced Electronics
  • Biomedical
  • Energy and Power Technologies
  • Space

DTIC Thesaurus Topics

  • Airborne Warning And Control System
  • Aircrafts
  • Alpha Particles
  • Complementary Metal-Oxide Semiconductors
  • Computer Programming
  • Cosmic Rays
  • Detection
  • Electronics Industry
  • Electronics Laboratories
  • Integrated Circuits
  • Measurement
  • Military Aircraft
  • Military Research
  • Modules (Electronics)
  • Nuclear Physics
  • Semiconductor Devices
  • Semiconductors

Fields of Study

  • Physics

Readers

  • Computer Programming and Software Development.
  • Integrated Circuit Design and Technology.
  • Nuclear and Radiation Engineering.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems