High Temperature Electronics Assessment.
Abstract
As part of the AFOSR initiative, the High Temperature Electronics Assessment group has successfully completed the evaluation of high temperature electronics (HTE) technology in Japan. The group consists of Prof. Robert Davis of North Carolina State University, Prof. Hadis Morkoc of the University of Illinois, Mr. Kenichiro Nakano of Wright Laboratory, and Dr. S. Joe Yakura of AQARD. Between 25 May and 2 June 93, the assessment group visited Kyoto University in Kyoto, Nichia Chemical Industries in Tokushima, Sharp in Nara, Fujitsu Limited in Kawasaki, and the National Institute for Research in Inorganic Materials in Tsukuba. A report on the current status of U.S. and Japanese HTE technology is available by contacting Dr. C. Witt of AFOSR/NE.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 07, 1993
- Accession Number
- ADA291853
Entities
People
- S. J. Yakura