High Resolution, Large Scale Measurement Processes.

Abstract

As spatial resolution of any measurement process increases, the amount of data per unit area (or volume) increases, leading to huge amounts of data and/or long measurement times when attempting to map small spatial variations in material properties over large spatial dimensions. It is therefore desirable to develop techniques in which high resolution information can be obtained, while maintaining the ability to cover large areas without being overwhelmed by measurement time or data. This report discusses the issues involved and seeks to formulate and advocate strategies that could guide such endeavors.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Jul 01, 1994
Accession Number
ADA292200

Entities

People

  • Jeff L. Brown

Organizations

  • Wright Laboratory

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Accuracy
  • Data Sets
  • Electronics
  • High Density
  • High Resolution
  • Low Resolution
  • Materials
  • Measurement
  • Measuring Instruments
  • Parallel Computing
  • Physical Properties
  • Processing Equipment
  • Roughness
  • Solid State Electronics
  • Standards
  • Statistical Sampling
  • Surface Properties

Readers

  • Coastal Oceanography
  • Distributed Systems and Data Platform Development
  • Systems Analysis and Design