Publications/Patents/Presentations/Honors Report: Force and Tunneling Microscopy Studies of Atomic Level Mechanical Properties of Solids.

Abstract

We are using atomic force microscopy (AFM) to characterize the tribological properties of materials on an atomic scale. For these experiments we employ an ultrahigh vacuum instrument which measures the lateral and normal forces and current through a tip in contact with a surface which can be positioned with subAngstrom resolution. Friction of a sharp tip on a surface is investigated by profiling the surface, sliding the tip across the surface while measuring the normal and parallel forces and contact resistance, and profiling the surface after sliding. jg p. 5

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Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1994
Accession Number
ADA292254

Entities

People

  • Gary M. Mcclelland

Organizations

  • International Business Machines Corporation (Armonk, NY)

Tags

Communities of Interest

  • Sensors

DTIC Thesaurus Topics

  • Chemical Vapor Deposition
  • Chemistry
  • Diamond Films
  • Dynamics
  • Energetic Materials
  • Field Emission
  • Films
  • Friction
  • Materials
  • Materials Science
  • Mechanical Properties
  • Microscopes
  • Microscopy
  • Surface Chemistry
  • Thin Films
  • Tribology
  • Ultrahigh Vacuum

Fields of Study

  • Physics

Readers

  • Thin Film Deposition Science.
  • Tribology (the study of the boundary interaction between sliding surfaces, lubrication, wear and friction).