Laser Simulation of Single-Event Effects: A State of the Art Review

Abstract

A pulsed laser system for simulating heavy-ion, single-event effects in semiconductor devices is described. The fundamentals of ion and laser interactions in silicon are compared. The results of several case studies demonstrate the utility of the laser technique for both hardness assurance and diagnostic purposes.

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Document Details

Document Type
Technical Report
Publication Date
Mar 01, 1995
Accession Number
ADA292308

Entities

People

  • S. Büchner

Organizations

  • Martin Marietta

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Case Studies
  • Charge Coupled Devices
  • Circuit Testers
  • Complementary Metal-Oxide Semiconductors
  • Computers
  • Dye Lasers
  • Electronics Laboratories
  • Laser Applications
  • Laser Beams
  • Lasers
  • Logic Gates
  • Modules (Electronics)
  • Power Electronics
  • Semiconductor Devices
  • Semiconductors
  • Test Equipment
  • Waveplates

Fields of Study

  • Physics

Readers

  • Integrated Circuit Design and Technology.
  • Pulsed Power and Plasma Physics.
  • Systems Analysis and Design

Technology Areas

  • Directed Energy
  • Microelectronics