Intelligent Finite Element Submodeling of Multichip Modules for Reliability Analysis.
Abstract
Modeling methodologies were developed, implemented, and tested for both rapid thermal finite element analysis of small-scale integrated circuit features in MCMs, and for thermal stress finite element analysis of chip-to-substrate interconnects. A three-step sequential analysis methodology was developed that is initiated with a macroscope thermal analysis of the entire MCM package. The macroscope finite element thermal analysis is then followed by two successive finite element thermal submodels of the hottest die first and then of the hottest die microfeature. In this manner, the thermal analysis process mathematically zooms into the hottest IC microfeature without resorting to supercomputer-size finite element models of the MCM. A two-step sequential thermal-stress finite element submodeling analysis procedure was also developed for thermally induced stress analysis of the most highly stressed wirebond or TAB interconnect in an MCM package. For automation purposes, both the IC thermal submodeling and the interconnect elastostatic submodeling methodologies were implemented into an existing blackboard-based, object-oriented MCM software design tool called the Intelligent MCM Analysis (IMCMA). (AN)
Document Details
- Document Type
- Technical Report
- Publication Date
- Dec 01, 1994
- Accession Number
- ADA292911
Entities
People
- Ian R. Grosse
- Michael Sheehy
- Prasanna Katragadda
- Shankar Raman
Organizations
- University of Massachusetts Amherst