Mission Critical Failure Effects Analysis Using Quantitative Techniques.

Abstract

This report addresses the problem of assessing the criticality of faults in a large digital system. In particular, it addresses simulation-based methods for determining the effectiveness of built-in-test. The approach is based on automated fault injection in a VHDL model of the system, and statistical analysis of the resulting behavior of the system. The behavioral entities of the VHDL model would correspond to Line Replaceable Units (LRIJs) or Line Replaceable Modules (LRMs). This report provides the top level design requirements and rationale for the detailed design of this capability.

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Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1994
Accession Number
ADA293098

Entities

People

  • Mark Royale
  • Nick Kanopoulos
  • Rahul Kapoor

Organizations

  • RTI International

Tags

Communities of Interest

  • C4I
  • Electronic Warfare
  • Materials and Manufacturing Processes
  • Weapons Technologies

DTIC Thesaurus Topics

  • Circuit Analysis
  • Computational Science
  • Computer Programming
  • Data Science
  • Databases
  • Detection
  • Detectors
  • Engineering
  • Engineers
  • Failure Mode And Effect Analysis
  • Graphical User Interface
  • Information Science
  • Probability
  • Reliability
  • Simulations
  • Simulators
  • User Interface

Fields of Study

  • Engineering

Readers

  • Computational Modeling and Simulation
  • Fault Tolerant Diagnosis of Black and White Balloon Isolation Tests Using ¥.
  • Integrated Circuit Design and Technology.