Measurement and Analysis Related to Infrared Emissions.

Abstract

PL/GPO field programs, CIRRIS-lA, EXCEDE III, FISTA and others have collected interferometer data i.e., interferograms, which were Fourier transformed to recover spectral information. Specific analysis has been performed to ascertain fundamental properties regarding the nature of the earth/atmosphere emissions. For the CIRRIS-1A nadir viewing interferometer data, fundamental relations regarding resolution limitations imposed by the finite character of the data are presented. Chromatic and achromatic sources are considered with conclusions on increasing spatial resolution. An extensive documentation on the earth/atmosphere ultraviolet radiation backgrounds is provided. Transformed EXCEDE III interferograms yielding high resolution spectra of electron (18 amp, 2.5 keV) irradiated air over 85 to 115 km are presented. The emission characteristics of many species are reveled including NO+ (delta v =1) with over 40 vibration-rotation lines isolated. Energy efficiency of NO+ (delta v= 1) photon production is derived. A computer model of electron impacting air was generated to follow radiation history of NO+. Detailed reaction rates have been derived for the nacient distribution of N+ + O2-NO+(v).

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Document Details

Document Type
Technical Report
Publication Date
Sep 30, 1994
Accession Number
ADA293296

Entities

People

  • B. D. Green
  • G. A. Vanasse
  • M. H. Bruce
  • R. E. Murphy

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies
  • Sensors
  • Space

DTIC Thesaurus Topics

  • Air Force
  • Chemical Reactions
  • Computational Science
  • Databases
  • Detectors
  • Diffraction
  • Electron Density
  • Electrons
  • Emission
  • Measurement
  • Optical Properties
  • Optics
  • Physical Properties
  • Quantum Yields
  • Scattering
  • Spectra
  • Spectroscopy

Fields of Study

  • Physics

Readers

  • Atmospheric Remote Sensing.
  • Image Processing and Computer Vision.
  • Spectroscopy.

Technology Areas

  • Microelectronics