Interface Microstructure and Composition of a YBa2CU3O(7-x) /N/ YBa2Cu3O(7-x) SNS Edge Junction with CaRuO3 as the Metallic Barrier.

Abstract

Superconductor-normal-superconductor (SNS) edge junctions consisting of YBa2Cu3O7/CaRuO3/YBa2Cu3O7 were fabricated on (001) LaAlO3 substrates using laser deposition. These devices display an excess resistance which may be related to the SN interface and normal layer structure or composition. High-resolution and conventional transmission electron microscopy were employed to investigate the SN interface structure to determine the degree of interface-matching and possible interfacial defects. Energy-loss spectroscopy and energy dispersive x-ray analysis were performed on the CaRuO3 film and near interface regions to determine the normal layer composition and to quantify the extent of interdiffusion between the CaRuO3 and YBCO films. Results are compared to recent investigations of SNS edge junctions consisting of YBa2Cu3O(7-x)/YBa2Cu(2.79)Co(0.21)O(7-x)/YBa2Cu3O(7-x). jg

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1994
Accession Number
ADA294847

Entities

People

  • K. Char
  • K. L. Merkle
  • S. Rozeveid

Organizations

  • Argonne National Laboratory

Tags

Communities of Interest

  • Air Platforms
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Composite Materials
  • Diffraction
  • Electron Energy
  • Electron Microscopes
  • Electron Microscopy
  • Films
  • High Resolution
  • Ion Beams
  • Materials
  • Materials Science
  • Microscopes
  • Microscopy
  • Resistance
  • Spectra
  • Thermal Expansion
  • Transmission Electron Microscopy
  • X Rays

Fields of Study

  • Physics

Readers

  • Superconducting Magnet Technology
  • Thin Film Deposition Science.

Technology Areas

  • Directed Energy
  • Directed Energy - Pulsed-Laser Deposition
  • Microelectronics
  • Microelectronics - Graphene